Title :
Non-Contact Bias Voltage Measurement on Analog Microelectronic Circuits via a Special Side-Electrode-Equipped Electro-Optic Tip
Author :
Kuo, Wen-Kai ; Kuo, Jen-Yu
Author_Institution :
Inst. of Electro-Opt. & Mater. Sci., Nat. Formosa Univ., Yunlin
Abstract :
The external electro-optic (EO) probing technique has been a very useful tool for the characterization of high-speed devices and circuits. In this paper, we propose a method to enable the traditional non-contact EO probing technique further direct DC bias voltage measurement via a special side-electrode-equipped electro-optic tip
Keywords :
analogue integrated circuits; electro-optical devices; integrated circuit testing; voltage measurement; analog microelectronic circuits; external electro-optic probing technique; high-speed devices; noncontact DC bias voltage measurement; special side-electrode-equipped electro-optic tip; Circuit testing; Electromagnetic compatibility; Electrooptic devices; Frequency; Materials science and technology; Microelectronics; Micromechanical devices; Probes; Signal generators; Voltage measurement;
Conference_Titel :
Optical MEMS and Their Applications Conference, 2006. IEEE/LEOS International Conference on
Conference_Location :
Big Sky, MT
Print_ISBN :
0-7803-9562-X
DOI :
10.1109/OMEMS.2006.1708280
