Title :
Mobile radio multi-link analysis
Author :
Sun, Jonqyin ; Reed, Irving S.
Author_Institution :
Radio Technol. Performance Lab., Lucent Technol., Whippany, NJ, USA
Abstract :
The error rates of MDPSK, coherent MPSK and noncoherent MFSK over slow flat, Rician fading channels are derived when linear diversity combining is applied to combat degradation due to fading. These closed-form solutions are sufficiently simple so that no approximations are needed for the numerical computations and general enough to include several cases of non-diversity, AWGN (the non-fading mode), Rayleigh fading, mixtures of Rayleigh and Rician fading (the mixed mode), and Rician fading. Error probabilities are graphically displayed for these different modulation schemes. The dependence of the power efficiency on the order of the diversity is plotted and examined for various values of M and a range of values of the Rician parameter K, the channel specular-to-scatter ratio for the measured statistics of mobile wireless channels. The analytical results presented are expected to provide much needed information for radio systems design and the evaluation of performance over fading channels when diversity reception is applied
Keywords :
AWGN; Rayleigh channels; Rician channels; diversity reception; error statistics; frequency shift keying; land mobile radio; phase shift keying; radio links; AWGN; MDPSK; Rayleigh fading; Rician fading; Rician parameter; channel specular-to-scatter ratio; closed-form solutions; coherent MPSK; diversity order; diversity reception; error probabilities; error probability; error rates; linear diversity combining; measured statistics; mixed mode fading; mobile radio multi-link analysis; mobile wireless channels; noncoherent MFSK; nondiversity; nonfading mode; power efficiency; radio systems design; slow flat Rician fading channels; AWGN; Closed-form solution; Degradation; Diversity reception; Error analysis; Error probability; Land mobile radio; Power measurement; Rayleigh channels; Rician channels;
Conference_Titel :
Vehicular Technology Conference, 2000. IEEE-VTS Fall VTC 2000. 52nd
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-6507-0
DOI :
10.1109/VETECF.2000.886322