مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2664763

Title :

Author Index

fYear :

2011

fDate :

3-5 Oct. 2011

Firstpage :

481

Lastpage :

482

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on

Conference_Location :

Vancouver, BC

Print_ISBN :

978-1-4577-1713-0

Type :

conf

DOI :

10.1109/DFT.2011.65

Filename :

6104477

Link To Document :