DocumentCode
2665579
Title
Profiling-Based Log Block Replacement Scheme in FTL for Update-Intensive Executions
Author
Paik, Joon-Young ; Chung, Tae-Sun ; Cho, Eun-Sun
Author_Institution
Dept. of Comput. Sci. & Eng, Chungnam Nat. Univ., Daejeon, South Korea
fYear
2011
fDate
24-26 Oct. 2011
Firstpage
182
Lastpage
188
Abstract
FTL (Flash Translation Layer) hides details of flash memory, providing file systems with an abstract view of the flash memory. For NAND flash memory, some previous researches have achieved dramatic performance enhancement by adopting log-based FTL, which records time-consuming write operations in log blocks, rather than executes them immediately. Log block replacement scheme plays an essential role in this method, due to the limitation of pre-reserved log block space, this method entails selecting some victims from the existing blocks and re-use them for newly issued operations. However, simple replacement algorithms are vulnerable to select such log blocks that will be used soon, which causes performance degradation. In this paper we propose a smarter log block replacement scheme to alleviate this problem by keeping busy log blocks from being selected, based on profiling and analyzing log block status. We show that our scheme reduces unnecessary time-consuming write operations and achieves performance improvement especially for the applications having intensive locality.
Keywords
NAND circuits; flash memories; FTL; NAND flash memory; flash translation layer; profiling based log block replacement scheme; update intensive executions; write operations; Degradation; Educational institutions; File systems; Flash memory; Hard disks; Proposals; NAND flash memory; flash translation layer (FTL); profiling information;
fLanguage
English
Publisher
ieee
Conference_Titel
Embedded and Ubiquitous Computing (EUC), 2011 IFIP 9th International Conference on
Conference_Location
Melbourne, VIC
Print_ISBN
978-1-4577-1822-9
Type
conf
DOI
10.1109/EUC.2011.57
Filename
6104524
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