Title :
Standardized ESD Testing Of Magnetoresistive Recording Heads
Author_Institution :
Quantum Corporation
Keywords :
Disk recording; Electrical resistance measurement; Electrostatic discharge; Electrostatic measurements; Immune system; Magnetic heads; Magnetoresistance; Measurement standards; Testing; Voltage;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597829