DocumentCode :
2668884
Title :
Thermal And Electrical Reliability Of Dual-stripe MR Heads
Author :
Zolla, H.G.
Author_Institution :
Headway Technologies
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Electric resistance; Immune system; Life estimation; Magnetic heads; Magnetic materials; Magnetoresistance; Temperature; Testing; Thermal degradation; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597830
Filename :
597830
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2668884
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