Title :
Single-qubit, entanglement-assisted and ancilla-assisted quantum process tomography
Author :
Altepeter, J.B. ; Branning, D. ; Jeffrey, E. ; Wei, C. ; Kwiat, P.G. ; Thew, R.T. ; O´Brien, J.L. ; Nielsen, M.A. ; White, A.G.
Author_Institution :
Dept. of Phys., Illinois Univ., Urbana, IL, USA
Abstract :
Quantum process tomography allows complete and precise characterization of a quantum operation. We report quantum process tomography of unitary, decohering, and partially polarizing operations using single-qubit, maximally entangled, and non-entangled input states.
Keywords :
optical tomography; quantum entanglement; quantum optics; ancilla-assisted process tomography; entangled input state; entanglement-assisted process tomography; nonentangled input state; quantum process tomography; single-qubit quantum state; Australia; Birefringence; Laser excitation; Photonic crystals; Physics computing; Polarization; Quantum computing; Quantum entanglement; State-space methods; Tomography;
Conference_Titel :
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-749-0
DOI :
10.1109/QELS.2003.238205
