• DocumentCode
    2669995
  • Title

    Results of the DESC test facility´s efforts to improve the quality of electronic replacement parts

  • Author

    Robinson, Glenda R. ; McNicholl, Brian P.

  • Author_Institution
    Defense Electronics Supply Center, Dayton, OH, USA
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    1276
  • Abstract
    Data indicating an increase in the quality of defense electronics supply center (DESC) sampled devices being supplied for the military services over the last few years are presented. Through continued testing and analysis a database that depicts the overall quality of the electronic parts DESC manages was constructed. DESC manages 93 federal supply classes (FSCs), and the test facility performs incoming inspection on selected new buys, monitors and samples the material in storage, and performs support testing for DESC and other government agencies. Test facility results serve to identify and correct deficient material before it is placed in inventory and to monitor the quality of older devices already in storage. Rejected lots are returned to the manufacturers, corrective actions required, and future purchases of these same and similar part-types screened. Feedback to suppliers and corrective actions are key ingredients to continuously improving the quality of electronic parts received by DESC
  • Keywords
    inspection; military computing; military systems; quality control; test facilities; DESC; QC; USA; analysis; continued testing; defense electronics supply center; electronic replacement; government agencies; incoming inspection; military services; support testing; test facility; Data analysis; Databases; Electronic equipment testing; Inspection; Material storage; Materials testing; Performance evaluation; Power capacitors; Quality management; Test facilities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1990.112955
  • Filename
    112955