NSEU impact on commercial avionics

Author

Matthews, David C. ; Dion, Michael J.

Author_Institution

Commercial Syst. Platform Archit., Rockwell Collins, Inc., Cedar Rapids, IA, USA

fYear

2009

fDate

26-30 April 2009

Firstpage

181

Lastpage

193

Abstract

Neutron single event upsets (NSEU) are known to have a significant impact on modern IC´s used in typical ground applications. The impact is orders of magnitude more frequent and critical when IC´s are used in avionics flying at 40,000 ft due to the higher atmospheric neutron flux and the potential for critical impact to human safety. As ICs become more sensitive and as systems use more bits, the systems become more sensitive. Avionics manufacturers use a variety of methods to manage the effects of NSEU, starting in design, through the product assessment process, and into the extended field life of products.

Keywords

aerospace safety; avionics; integrated circuit design; integrated circuit reliability; neutron effects; radiation hardening (electronics); IC design; NSEU impact; altitude 40000 feet; atmospheric neutron flux; commercial avionics; extended field product life; human safety; neutron single event upsets; product assessment process; Aerospace electronics; CMOS technology; Circuits; Geometry; Hot carriers; MOSFETs; Measurement standards; Radiation hardening; Space technology; Transistors; Avionics; ECC; EDAC; NSEU; Safety-Critical; Upset;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 2009 IEEE International

Conference_Location

Montreal, QC

ISSN

1541-7026

Print_ISBN

978-1-4244-2888-5

Electronic_ISBN

1541-7026

Type

conf

DOI

10.1109/IRPS.2009.5173249

Filename

5173249