Title :
Experimental Assessment of Bilateral Fin-Line Impedance for Device Matching
Author :
Willing, H.A. ; Spielman, B.E.
Abstract :
This paper describes the results of an experimental investigation of bilateral fin-line impedance characteristics for matching to small-chip devices. The results from two different experimental approaches are presented and compared with computed results.
Keywords :
Dielectric measurements; Finline; Geometry; Impedance; Millimeter wave integrated circuits; Millimeter wave technology; Probes; Rectangular waveguides; Semiconductor device measurement; Waveguide discontinuities;
Conference_Titel :
Microwave Symposium Digest, 1981 IEEE MTT-S International
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/MWSYM.1981.1129836
