Title :
Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS)
Abstract :
The following topics are dealt with: ATPG; fault tolerance; fault simulation; analog and mixed circuit testing; software testing; BIST; fault diagnosis; design for testability; IDDQ and bridging faults; testability analysis; self-checking; signature analysis; test and diagnosis
Keywords :
automatic test equipment; automatic testing; built-in self test; design for testability; digital simulation; fault diagnosis; integrated circuit testing; logic testing; mixed analogue-digital integrated circuits; program testing; reliability; signal processing; ATPG; BIST; IDDQ; analog diagnosis; bridging faults; design for testability; fault diagnosis; fault simulation; fault tolerance; mixed circuit testing; self-checking; signature analysis; software testing; testability analysis;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing, China
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398764
