Title :
Limitations of built-in current sensors (BICS) for IDDQ testing
Author :
Menon, Sankaran M. ; Malaiya, Yashwant K. ; Jayasumana, Anura P. ; Tong, Carol Q.
Author_Institution :
Colorado State Univ., Ft. Collins, CO, USA
Abstract :
Quiescent current (IDDQ) drawn by a static CMOS device is extremely small and is of the order of nanoamperes. Under many faults, (IDDQ) can increase by several orders of magnitude. Either an external or an on-chip current sensor can be used to detect enhanced static current drawn by a static CMOS device. An on-chip sensor, termed a BICS (Built-In Current Sensor) can be significantly faster. Implementation of BICS has received a lot of interest in the recent years. Some limitations posed by BICS on IDDQ measurement caused due to increase in IDDQ settling time as well as propagation delay is considered. Results indicate that careful attention needs to be given to circuit partitioning for implementing BICS. Some of the considerations that need to be taken into account while designing new BICS are presented
Keywords :
CMOS logic circuits; built-in self test; electric current measurement; electric sensing devices; integrated circuit testing; logic testing; IDDQ testing; built-in current sensors; circuit partitioning; inverter chain; leakage current; propagation delay; settling time; static CMOS device; CMOS logic circuits; Circuit faults; Circuit testing; Condition monitoring; Electrical fault detection; Leak detection; Leakage current; Life testing; Logic devices; Logic testing;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398812
