DocumentCode
2674032
Title
Application-level fault tolerance in the orbital thermal imaging spectrometer
Author
Ciocca, E. ; Koren, I. ; Koren, Z. ; Krishna, C.M. ; Katz, D.S.
Author_Institution
Massachusetts Univ., Amherst, MA, USA
fYear
2004
fDate
3-5 March 2004
Firstpage
43
Lastpage
48
Abstract
Systems that operate in extremely volatile environments, such as orbiting satellites, must be designed with a strong emphasis on fault tolerance. Rather than rely solely on the system hardware, it may be beneficial to entrust some of the fault handling to software at the application level, which can utilize semantic information and software communication channels to achieve fault tolerance with considerably less power and performance overhead. We show the implementation and evaluation of such a software-level approach, application-level fault tolerance and detection (ALFTD) into the orbital thermal imaging spectrometer (OTIS).
Keywords
error detection; error statistics; infrared imaging; infrared spectrometers; software fault tolerance; spectroscopy computing; application-level fault tolerance; error statistics; fault detection; orbital thermal imaging spectrometer; software based fault tolerance; Application software; Communication channels; Communication system software; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Satellites; Software performance; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Dependable Computing, 2004. Proceedings. 10th IEEE Pacific Rim International Symposium on
Print_ISBN
0-7695-2076-6
Type
conf
DOI
10.1109/PRDC.2004.1276551
Filename
1276551
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