• DocumentCode
    2676783
  • Title

    Multiple-Window Anomaly Detection for Hyperspectral Imagery

  • Author

    Liu, Wei-min ; Chang, Chein-I

  • Author_Institution
    Dept. of CSEE, Univ. of Maryland, Baltimore, MD
  • Volume
    2
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    Anomaly detection is of particular interest in hyperspectral image analysis since many unknown and subtle signals which cannot be resolved by multispectral sensors can now be uncovered by hyperspectral imagers. More importantly, the signals of this type generally cannot be identified by visual assessment or prior knowledge and provide crucial and critical information for data analysis. Many anomaly detectors have been designed based on the most widely used anomaly detector developed by Reed and Yu, called RX detector (RXD). However, a key issue in making RX detector-like anomaly detectors successful is how to effectively utilize the information provided by the sample correlation, e.g., sample covariance matrix used by RXD. This paper develops a concept of designing anomaly detectors which includes RXD-like anomaly detectors as special cases. It is referred to as multiple-window anomaly detection (MWAD) which makes use of multiple windows with varying sizes to capture different levels of local spectral variations so that anomalous targets of various sizes can be characterized and interpreted by different window sizes. With this new MWAD, many interesting findings can be derived including the RXD-like anomaly detectors as its special cases.
  • Keywords
    data analysis; geophysical techniques; MWAD technique; RX detector; data analysis; hyperspectral imagery; multiplewindow anomaly detection; Covariance matrix; Data analysis; Detectors; Hyperspectral imaging; Hyperspectral sensors; Image analysis; Image resolution; Image sensors; Signal processing; Signal resolution; DWEST; Nested window detector; RXD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4778922
  • Filename
    4778922