DocumentCode
2676969
Title
Microstrip Measurements
Author
Edwards, T.C.
fYear
1982
fDate
15-17 June 1982
Firstpage
338
Lastpage
341
Abstract
Extensive measurements are essential for the characterisation of microstrip and design using this medium. Resonator methods are significant and these are given prominence in this tutorial/overview paper. Brief considerations are included of parallel-coupled microstrips, Q-factor measurements, and TDR techniques.
Keywords
Circuit testing; Electric variables measurement; Electrooptical waveguides; Frequency domain analysis; Frequency measurement; Microstrip resonators; Permittivity measurement; Q factor; Signal resolution; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1982 IEEE MTT-S International
Conference_Location
Dallas, TX, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1982.1130712
Filename
1130712
Link To Document