DocumentCode :
2678361
Title :
Recent measurements of material constants versus temperature for langatate, langanite and langasite
Author :
Malocha, D.C. ; da Cunha, M.P. ; Adler, E. ; Smythe, RC ; Frederick, S. ; Chou, M. ; Helmbold, R. ; Zhou, Y.S.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Central Florida Univ., Orlando, FL, USA
fYear :
2000
fDate :
2000
Firstpage :
200
Lastpage :
205
Abstract :
Measurements, experiments and extracted parameters of the material constants of langatate (LGT), langanite (LGN), and langasite (LGS) versus temperature are presented from work conducted at the University of Central Florida. The data presented is from material grown by Crystal Photonics,, Inc. and is part of a contract on growth, characterization and device implementation of these materials. Parameters presented include the material expansion and mass density coefficients, stiffness constants, and dielectric constants. A paper in this proceedings by R. Smythe, et. al., presents the determination of the piezoelectric constants. Discussion of the experimental technique using swept frequency scattering parameter data (S11) for obtaining pulse echo data, and capacitance measurements are presented. Comparison of results to preciously published and current data on BAW and SAW parameters is provided. Important parameter contour plots for LGS and LGN slow-shear mode are given. TCF comparisons for several BAW cuts are presented
Keywords :
S-parameters; elastic moduli measurement; elastic waves; piezoelectric materials; piezoelectricity; swept-frequency reflectometry; BAW parameters; LGN; LGS; LGT; LaGaNb; LaGaSi; LaGaTa; S11; SAW parameters; capacitance measurements; delay measurement; dielectric constants; growth; langanite; langasite; langatate; mass density coefficients; material constants; material expansion; parameter contour plots; pulse echo data; slow-shear mode; stiffness constants; swept frequency scattering parameter data; Conducting materials; Contracts; Crystalline materials; Data mining; Dielectric constant; Dielectric materials; Frequency; Photonic crystals; Scattering parameters; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and Exhibition, 2000. Proceedings of the 2000 IEEE/EIA International
Conference_Location :
Kansas City, MO
ISSN :
1075-6787
Print_ISBN :
0-7803-5838-4
Type :
conf
DOI :
10.1109/FREQ.2000.887354
Filename :
887354
Link To Document :
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