DocumentCode :
2679127
Title :
3D Hall probe integrated in 0.35 μm CMOS technology for magnetic field pulses measurements
Author :
Pascal, Joris ; Hébrard, Luc ; Frick, VIncent ; Blondé, Jean-Philippe
Author_Institution :
Inst. d´´Electron. du Solide et des Syst., ULP Strasbourg, Strasbourg
fYear :
2008
fDate :
22-25 June 2008
Firstpage :
97
Lastpage :
100
Abstract :
This paper presents a 3 dimensional magnetometer based on Hall effect sensors integrated without any post processing in a standard low cost 0.35 mum CMOS technology. The system is dedicated to magnetic pulses measurements under a strong static field. Two vertical Hall devices (VHD) are sensitive to the components of the magnetic field oriented in the plane of the chip, while a horizontal Hall device (HHD) is sensitive to the component of the magnetic field orthogonally oriented to the plane of the chip. 3 identical instrumental chains are integrated to perform amplification of the 3 Hall voltages. The system implements a compensation of the static magnetic field and allows to measure magnetic fields pulses with a resolution of 79 muT over a [5 Hz - 1.6 kHz] bandwidth. Pulses are in the range from hundreds of muT to tens of mT in the frequency range from 1 Hz to 10 kHz. The static field is compensated up to 1.5 T. The spatial resolution is 44 mum. The system power consumption has been optimized to 15 mW.
Keywords :
CMOS integrated circuits; Hall effect devices; magnetic field measurement; 3 dimensional magnetometer; 3D Hall probe; CMOS technology; frequency 1 Hz to 10 kHz; horizontal Hall device; magnetic field pulses measurements; power 15 mW; size 0.35 mum; vertical Hall devices; CMOS process; CMOS technology; Costs; Hall effect devices; Magnetic field measurement; Magnetometers; Pulse amplifiers; Pulse measurements; Semiconductor device measurement; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems and TAISA Conference, 2008. NEWCAS-TAISA 2008. 2008 Joint 6th International IEEE Northeast Workshop on
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2331-6
Electronic_ISBN :
978-1-4244-2332-3
Type :
conf
DOI :
10.1109/NEWCAS.2008.4606330
Filename :
4606330
Link To Document :
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