DocumentCode :
2679925
Title :
An Embedded System Design of Selective Window Speckle Noise Suppression Filter for Ultrasound Images
Author :
Mazumdar, B. ; Mediratta, A. ; Bhattacharyya, J. ; Banerjee, S.
Author_Institution :
Dept. of Electron. & Electr. Commun. Eng., IIT, Kharagpur
fYear :
2006
fDate :
8-11 Aug. 2006
Firstpage :
324
Lastpage :
327
Abstract :
This paper presents a novel approach for speckle reduction of ultrasound image and its implementation using EDK 7.1i (Embedded Development Kit) on ML310 embedded development platform wherein the image is read from an image data file to a set of slave registers in the filter core through the On-Chip Peripheral Bus (OPB) and thereby processed in the filter core. Speckle is a phenomenon in ultrasonic pulse-echo measurements, caused by the coherent nature of the imaging source. When an acoustic wave propagates through a scattering medium, all the wavelets generated by the reflection of the incident wave on randomly distributed scatterers, interfere on the surface of the receiving transducer in a constructive or destructive way, depending on their relative phase forming speckle noise
Keywords :
biomedical ultrasonics; embedded systems; filtering theory; image denoising; image resolution; median filters; medical image processing; peripheral interfaces; speckle; wavelet transforms; EDK 7.1i; ML310 embedded development platform; acoustic wave propagation; embedded development kit; embedded system design; filter core; image data file; imaging source; incident wave reflection; on-chip peripheral bus; phase forming speckle noise; randomly distributed scatterers; receiving transducer; selective window speckle noise suppression filter; slave registers; speckle reduction; ultrasonic pulse-echo measurement; ultrasound images; wavelets; Acoustic imaging; Acoustic measurements; Acoustic pulses; Acoustic scattering; Embedded system; Filters; Pulse measurements; Speckle; Ultrasonic imaging; Ultrasonic variables measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial and Information Systems, First International Conference on
Conference_Location :
Peradeniya
Print_ISBN :
1-4244-0322-7
Type :
conf
DOI :
10.1109/ICIIS.2006.365746
Filename :
4216607
Link To Document :
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