Title :
Metal etcher characterization using flash memory cells as charge sensors
Author :
Alba, S. ; Colognese, A. ; Ghio, E.
Author_Institution :
SGS-THOUSON Microelectronics
Keywords :
Etching; Flash memory cells; Inorganic materials; Metallization; Microelectronics; Plasma applications; Plasma sources; Radio frequency; Sensor phenomena and characterization; Threshold voltage;
Conference_Titel :
Materials for Advanced Metallization, 1997. MAM '97 Abstracts Booklet., European Workshop
Conference_Location :
Villard de Lans, France
DOI :
10.1109/MAM.1998.887550