Title :
Simulation of Hyperspectral Scene with Full Adjacency Effect
Author :
Guorui, Jia ; Huijie, Zhao ; Na, Li
Author_Institution :
Key Lab. of Precision Opto-Mechatron. Technol., Beihang Univ., Beijing
Abstract :
Adjacency effect contaminates pixel spectrum in remotely sensed hyperspectral data and should be fully considered in hyperspectral scene simulation. But existing simulation method cannot model all the mechanisms that induce adjacency effect or complete the simulation with full adjacency effect in a few hours. A method is proposed to simulate the hyperspectral radiance data cube with full adjacency effect in a reasonable time. The method depends on a physically-based radiative transfer equation, in which parameters relating to atmospheric and geometric conditions are calculated through four times of MODTRAN4 running and surrounding average reflectance are calculated based on the atmospheric single scattering point spread function (PSF). The sensor´s spatial resolution, spectral response function and signal-to-noise ratio (SNR) are simulated to generate a calibrated data cube. Performance of the method is validated through simulating a set of AVIRIS radiance data and comparing it with the actual one.
Keywords :
atmospheric radiation; atmospheric techniques; radiative transfer; remote sensing; sunlight; AVIRIS radiance data; MODTRAN4; Point Spread Function; Signal-to-Noise Ratio; adjacency effect; atmospheric condition; atmospheric single scattering; geometric condition; hyperspectral radiance data; hyperspectral scene simulation; radiative transfer equation; remote sensing; sensor´s spatial resolution; solar radiation; spectral response function; Atmospheric modeling; Equations; Hyperspectral imaging; Hyperspectral sensors; Layout; Reflectivity; Scattering parameters; Signal generators; Signal to noise ratio; Spatial resolution; Hyperspectal; adjacency effect; atmospheric PSF; radiance; simulation;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4779450