DocumentCode
2686158
Title
A test set for LEDs life model estimation
Author
Albertini, Andrea ; Masi, Maria Gabriella ; Mazzanti, Giovanni ; Peretto, Lorenzo ; Tinarelli, Roberto
Author_Institution
Dept. of Electr. Eng., Univ. of Bologna, Bologna, Italy
fYear
2010
fDate
3-6 May 2010
Firstpage
426
Lastpage
431
Abstract
Life models relate the time to failure to the applied stress. They can be derived starting from knowledge of chemical/physical phenomena involved in the ageing process caused by the stress or by means of regressive techniques on data acquired in ALT-based procedure. Anyway, experimental tests are needed. This paper deals with a test system implemented to estimate a life model for LEDs where the forward current is considered as stress.
Keywords
ageing; failure analysis; life testing; light emitting diodes; stress analysis; ALT-based procedure; LED test system; ageing process; chemical-physical phenomena; life model estimation; regressive techniques; stress; Aging; Chemical processes; Cost function; Failure analysis; Life estimation; Life testing; Light emitting diodes; Preventive maintenance; System testing; Thermal stresses; LEDs; MTTF; Reliability; accelerated test; life model;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location
Austin, TX
ISSN
1091-5281
Print_ISBN
978-1-4244-2832-8
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2010.5488033
Filename
5488033
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