Title :
DFT for improving the testability of parametric resistor faults
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., China
Abstract :
This paper describes a test approach for a strain gauge measurement circuit. The test method is based on the analysis of equivalent faults extracted before the test solution conceptualization stage. Experimental results obtained demonstrate the effectiveness and validity of the approach.
Keywords :
design for testability; fault diagnosis; resistors; strain gauges; DFT; equivalent faults; parametric resistor faults; strain gauge measurement circuit; test method; test solution conceptualization stage;
Conference_Titel :
ASIC, 2003. Proceedings. 5th International Conference on
Print_ISBN :
0-7803-7889-X
DOI :
10.1109/ICASIC.2003.1277420
