DocumentCode :
2688456
Title :
Thermal transient testing of packages without a tester
Author :
Székely, Vladimir ; Rencz, Márta ; Courtois, Bernard
Author_Institution :
Dept. of Electron Devices, Budapest Tech. Univ., Hungary
fYear :
1998
fDate :
8-10 Dec 1998
Firstpage :
236
Lastpage :
239
Abstract :
Thermal transient testing is an excellent method to measure the thermal properties of packages, to check die attach quality and to detect and localise physical defects in the heat removal path. The measured transient responses are also the basis for compact, dynamic thermal model generation. The measurement set-up for the thermal transient experiments is rather complex, including expensive dedicated equipment. The purpose of this paper is to present an alternative solution for thermal transient testing which eliminates the need for expensive hardware. A method for compact thermal model generation is also provided
Keywords :
fault location; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; microassembling; quality control; thermal analysis; transient analysis; transient response; die attach quality; dynamic thermal model generation; heat removal path; measurement set-up; package thermal properties; packages; physical defect detection; physical defect localisation; test hardware cost; tester; thermal model generation; thermal transient; thermal transient testing; transient responses; Area measurement; Circuit testing; Hardware; Packaging machines; Semiconductor device measurement; Semiconductor device packaging; Software measurement; Software testing; Temperature sensors; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
Type :
conf
DOI :
10.1109/EPTC.1998.756008
Filename :
756008
Link To Document :
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