Title :
Sub-Pixel Stereo-Matching for DEM Generation from Narrow Baseline Stereo Imagery
Author :
Morgan, Gareth Llewellyn Keith ; Liu, Jian Guo ; Yan, Hongshi
Author_Institution :
Dept. of Earth Sci. & Eng., Imperial Coll. London, London
Abstract :
We demonstrate an automated stereo-matching algorithm capable of extracting disparity/depth information from stereo image pairs with an unconventionally narrow baseline separation i.e. low base-to-height ratio (B/H), thus potentially allowing digital elevation models (DEMs) to be derived from images that previously might not have been considered suitable for stereo applications. For very small B/H ratios the disparity magnitudes may be reduced to sub-pixel levels that conventional stereo-matching algorithms fail to measure. By utilising a new sub-pixel image matching algorithm, based upon the phase correlation (PC) method, we are able to measure the very subtle, sub-pixel, disparities that result from image pairs with B/H ratios as small as 0.06. Initial tests with this algorithm on SPOT 5 satellite image data have demonstrated that this routine is capable of generating very dense and detailed disparity/depth maps of a scene for DEM generation without prior knowledge of the satellite/sensor parameters, whilst also being exceptionally sensitive to small scale textural features, robust to noise, and efficient to implement.
Keywords :
digital elevation models; geophysical signal processing; image matching; remote sensing; stereo image processing; DEM generation; SPOT 5 satellite imagery; depth information extraction; digital elevation models; disparity; narrow baseline stereo imagery; phase correlation method; stereo image pairs; subpixel stereo-matching; Data mining; Digital elevation models; Image matching; Image sensors; Layout; Noise robustness; Phase measurement; Satellites; Sensor phenomena and characterization; Testing; DEM; Narrow baseline stereo; phase correlation; stereo-matching; sub-pixel;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4779593