Title :
Adaptive circuits using pFET floating-gate devices
Author :
Hasler, Paul ; Minch, Bradley A. ; Diorio, Chris
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
In this paper, we describe our floating-gate pFET device, with its many circuit applications and supporting experimental measurements. We developed these devices in standard double-poly CMOS technologies by utilizing many effects inherent in these processes. We add floating-gate charge by electron tunneling, and we remove floating-gate charge by hot-electron injection. With this floating-gate technology, we cannot only build analog EEPROMs, we can also implement adaptation and learning when we consider floating-gate devices to be circuit elements with important time-domain dynamics. We start by discussing non-adaptive properties of floating-gate devices and we present two representative non-adaptive applications. First, we discuss using the floating-gate pFETs as non-volatile voltage sources or potentiometers (e-pots). Second, we discuss using floating-gate pFETs to build translinear circuits that compute the product of powers of the input currents. We then discuss the physics, behavior, and applications of adaptation using floating-gate pFETs. The physics of adaptation starts with floating-gate pFETs with continuous tunneling and injection currents. A single floating-gate MOS device operating with continuous-time tunneling and injection currents can exhibit either stabilizing or destabilizing behaviors. One particular application is an autozeroing floating-gate amplifier (AFGA) that uses tunneling and pFET hot-electron injection to adaptively set its DC operating point. Continuous-time circuits comprising multiple floating-gate MOS devices show various competitive and cooperative behaviors between devices. These floating-gate circuits can be used to build silicon systems that adapt and learn
Keywords :
CMOS analogue integrated circuits; adaptive systems; analogue processing circuits; continuous time systems; hot carriers; tunnelling; DC operating point setting; EEPROMs; adaptive circuits; autozeroing floating-gate amplifier; continuous-time circuits; continuous-time tunneling; destabilizing behavior; electron tunneling; floating-gate MOS device; hot-electron injection; learning; nonvolatile voltage sources; pFET floating-gate devices; potentiometers; stabilizing behavior; standard double-poly CMOS technologies; translinear circuits; CMOS process; CMOS technology; Circuits; EPROM; MOS devices; Physics; Secondary generated hot electron injection; Standards development; Time domain analysis; Tunneling;
Conference_Titel :
Advanced Research in VLSI, 1999. Proceedings. 20th Anniversary Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7695-0056-0
DOI :
10.1109/ARVLSI.1999.756050