Title :
Nanoscale coherent light sources on GaAs and Si using single rolled-up InGaAs/GaAs quantum dot microtubes
Author :
Li, F. ; Vicknesh, S. ; Mi, Z.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
In this report we study the nanoscale coherent light sources on GaAs and Si using single rolled-up InGaAs/GaAs quantum dot microtubes. Such microtubes are formed by self-rolling of coherently strained InGaAs/GaAs quantum dot heterostructures through controlled release from their host substrates [1-3]. We have developed a substrate-on-substrate transfer process [3] and realized nearly defect-free quantum dot microtubes on Si that were not possible before. Emission characteristics of InGaAs/GaAs quantum microtubes were studied using micro-photoluminescence spectroscopy at 300 K. A typical emission spectrum measured from the freestanding region of a microtube without any intentional surface corrugations (inset) is shown in Fig. 3(a) (solid line), which is characterized by a sequence of regularly spaced optical resonance modes superimposed on a broad quantum dot emission spectrum (dotted line). These resonance modes arise from photons circulated around the periphery of the microtube by total internal reflections.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; light sources; photoluminescence; semiconductor heterojunctions; semiconductor quantum dots; InGaAs-GaAs; InGaAs/GaAs quantum dot heterostructures; emission characteristics; micro-photoluminescence spectroscopy; nanoscale coherent light sources; optical resonance modes; quantum dot emission spectrum; single rolled-up InGaAs/GaAs quantum dot microtubes; substrate-on-substrate transfer process; total internal reflections; Corrugated surfaces; Gallium arsenide; Indium gallium arsenide; Light sources; Optical reflection; Quantum dots; Resonance; Spectroscopy; Stimulated emission; Strain control;
Conference_Titel :
Device Research Conference, 2009. DRC 2009
Conference_Location :
University Park, PA
Print_ISBN :
978-1-4244-3528-9
Electronic_ISBN :
978-1-4244-3527-2
DOI :
10.1109/DRC.2009.5354918