Title :
Centering and Tolerancing the Components of Microwave Amplifiers
Author :
McFarland, A. ; Purviance, J. ; Loescher, D. ; Diegert, K. ; Ferguson, T.
fDate :
May 9 1975-June 11 1987
Abstract :
A simple graphical statistical method of circuit design centering and tolerancing for a desired circuit manufacturing yield is presented. The method is iterative and based on a parametric study of circuit yield estimates using Monte Carlo circuit analysis. Circuit elements including device s-parameters and distributed parameters as well as lumped components are considered. An application of this method is given in an example.
Keywords :
Circuit analysis; Circuit synthesis; Iterative methods; Manufacturing; Microwave amplifiers; Microwave devices; Monte Carlo methods; Parametric study; Statistical analysis; Yield estimation;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132490
