DocumentCode :
269437
Title :
Performances of Strained Nanowire Devices: Ballistic Versus Scattering-Limited Currents
Author :
Viet-Hung Nguyen ; Triozon, Francois ; Bonnet, Frédéric D. R. ; Niquet, Yann-Michel
Author_Institution :
INAC, SP2M, UJF-Grenoble 1, Grenoble, France
Volume :
60
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
1506
Lastpage :
1513
Abstract :
We discuss the performances of (001) and (110) oriented gate-all-around silicon nanowire (Si NW) transistors within a nonequilibrium Green´s functions framework, taking surface roughness and phonon scatterings into account. We show, in agreement with previous studies, that uniaxial tensile (respectively, compressive) strains can significantly improve the mobility of electrons (respectively, holes) in the channel. This does not, however, necessarily result in a comparable enhancement of the device performances. Indeed, the current in short channels is limited by both the scattering and the number of sub-bands available for carrier transport in quantum confined systems (intrinsic “ballistic” resistance). The dependence of the mobility and ballistic resistance on strains can be different, which calls for a careful design of the devices. We show, in this respect, that (110) Si NWs provide the best opportunities for strain engineering in ultimate short channel transistors.
Keywords :
Green´s function methods; MOSFET; ballistic transport; electron mobility; elemental semiconductors; hole mobility; nanowires; silicon; surface roughness; Si; ballistic current; carrier transport; compressive strain; device performance; electron mobility; gate-all-around silicon nanowire transistors; hole mobility; intrinsic ballistic resistance; nonequilibrium Green´s functions framework; phonon scatterings; quantum confined systems; scattering-limited current; strain engineering; strained nanowire devices; surface roughness; ultimate short channel transistors; uniaxial tensile strain; Logic gates; Performance evaluation; Phonons; Resistance; Scattering; Silicon; Strain; Green functions; mobility; nanowire; strain; transistor;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2248734
Filename :
6480912
Link To Document :
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