• DocumentCode
    269772
  • Title

    Polymer composites with a large nanofiller content: a case study involving epoxy

  • Author

    Fréchette, Michel ; Preda, I. ; Castellon, J. ; Krivda, A. ; Veillette, R. ; Trudeau, Michel ; David, E.

  • Author_Institution
    Mater. Sci., Hydro-Quebec´s Res. Inst. (IREQ), Varennes, QC, Canada
  • Volume
    21
  • Issue
    2
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    434
  • Lastpage
    443
  • Abstract
    A situation involving a polymer nanocomposite containing a large amount of inorganic filler was studied. An epoxy nanocomposite with a content of 20% wt of nanosilica was used. Emphasis was put on imaging at the nanoscale and some dielectric responses were measured using dielectric spectroscopy. Using Transmission Electron Microscopy (TEM) in a High-Angle Annular Dark Field (HAADF) scanning mode, an area of less than 4 nm around an isolated particle was imaged and found to have a very low atomic number. With Atomic Force Microscopy (AFM) in peak-force mode agglomerates were clearly imaged. With respect to the dielectric response, no interfacial relaxation peak was observed. In presence of some agglomeration, the real part of the permittivity was found to be decreased by the addition of the nanofiller. Higher-field measurements unravelled nonlinear variations of the conduction versus an applied field. It was shown that the use of a large filler concentration resulted in greater interphase overlapping between the nanoparticles.
  • Keywords
    atomic force microscopy; filled polymers; nanocomposites; nanoparticles; permittivity; transmission electron microscopy; AFM; HAADF scanning mode; TEM; applied field; atomic force microscopy; dielectric responses; dielectric spectroscopy; epoxy nanocomposite; high-angle annular dark field scanning mode; higher-field measurements; inorganic filler; large filler concentration; large nanofiller content; nanoparticles; nanosilica; nonlinear variations; peak-force mode agglomerates; permittivity; polymer nanocomposite; transmission electron microscopy; Atomic force microscopy; Dielectrics; Nanoparticles; Scanning electron microscopy; Transmission electron microscopy; Nanodielectrics; dielectric responses; electron microscopy; epoxy composites; nanosilica filler; particle interphase; polymer nanocomposites;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2013.004164
  • Filename
    6783033