DocumentCode :
2697785
Title :
A test concept for circuit level aging demonstrated by a differential amplifier
Author :
Chouard, Florian R. ; Werner, Christoph ; Schmitt-Landsiede, Doris ; Fulde, Michael
Author_Institution :
Lehrstuhl fur Tech. Elektron., Tech. Univ. Munchen, Munich, Germany
fYear :
2010
fDate :
2-6 May 2010
Firstpage :
826
Lastpage :
829
Abstract :
In this work a general concept for accelerated aging of linear analog circuit blocks is proposed. Due to the interaction of diverse aging mechanisms, circuit behavior in an arbitrary effect accelerated stress setup may show large deviation to the aging under nominal circuit conditions. The proposed analytical small signal analysis proves to be a fast and easy way to obtain the contributions of all degrading transistors with respect to the output monitor of the circuit. Circuit aging simulations over temperature rise as well as supply and input voltage scaling show that single effect acceleration varies significantly between the involved mechanisms. This causes deviations in the aging output monitor compared to the aging under nominal circuit conditions. Based on these findings an accelerated circuit level aging test concept - applicable to linear circuits - is developed and evaluated for the example of a two-stage differential amplifier.
Keywords :
ageing; analogue circuits; circuit reliability; differential amplifiers; life testing; accelerated circuit level aging test concept; analytical small signal analysis; circuit aging simulations; circuit reliability; diverse aging mechanisms; input voltage scaling; linear analog circuit; single effect acceleration; transistors; two-stage differential amplifier; Accelerated aging; Analog circuits; Circuit simulation; Circuit testing; Degradation; Differential amplifiers; Signal analysis; Stress; Temperature; Voltage; HCI; NBTI; PBTI; aging acceleration; circuit reliability; degradation; testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1541-7026
Print_ISBN :
978-1-4244-5430-3
Type :
conf
DOI :
10.1109/IRPS.2010.5488724
Filename :
5488724
Link To Document :
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