DocumentCode
269792
Title
Power- and area-efficient Approximate Wallace Tree Multiplier for error-resilient systems
Author
Bhardwaj, Kshitij ; Mane, Pravin S. ; Henkel, Jörg
Author_Institution
Electr. & Electron. Eng., BITS Pilani, Pilani, India
fYear
2014
fDate
3-5 March 2014
Firstpage
263
Lastpage
269
Abstract
Today in sub-nanometer regime, chip/system designers add accuracy as a new constraint to optimize Latency-Power-Area (LPA) metrics. In this paper, we present a new power and area-efficient Approximate Wallace Tree Multiplier (AWTM) for error-tolerant applications. We propose a bit-width aware approximate multiplication algorithm for optimal design of our multiplier. We employ a carry-in prediction method to reduce the critical path. It is further augmented with hardware efficient precomputation of carry-in. We also optimize our multiplier design for latency, power and area using Wallace trees. Accuracy as well as LPA design metrics are used to evaluate our approximate multiplier designs of different bit-widths, i.e. 4 × 4, 8 × 8 and 16 × 16. The simulation results show that we obtain a mean accuracy of 99.85% to 99.965%. Single cycle implementation of AWTM gives almost 24% reduction in latency. We achieve significant reduction in power and area, i.e. up to 41.96% and 34.49% respectively that clearly demonstrates the merits of our proposed AWTM design. Finally, AWTM is used to perform a real time application on a benchmark image. We obtain up to 39% reduction in power and 30% reduction in area without any loss in image quality.
Keywords
multiplying circuits; trees (mathematics); area-efficient approximate Wallace tree multiplier; bit-width aware approximate multiplication algorithm; carry-in prediction method; error-resilient systems; latency reduction; optimal design; power-efficient approximate Wallace tree multiplier; Accuracy; Adders; Approximation algorithms; Approximation methods; Delays; Hardware; Approximate multiplier; Bit-width aware multiplication algorithm; Error-resilient systems; Wallace tree;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-3945-9
Type
conf
DOI
10.1109/ISQED.2014.6783335
Filename
6783335
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