Title :
Measurement of neutron-induced single event transient pulse width narrower than 100ps
Author :
Nakamura, Hideyuki ; Tanaka, Katsuhiko ; Uemura, Taiki ; Takeuchi, Kan ; Fukuda, Toshikazu ; Kumashiro, Shigetaka
Author_Institution :
MIRAI-SELETE, NEC Sagamihara Plant, Sagamihara, Japan
Abstract :
A novel SET pulse measurement circuit is proposed which can detect pulses narrower than 100 ps. Alternation of SET pulses during the propagation through the chain of target cells is minimized, which is attributed to small chain length (typically 20). This circuit configuration contributes to obtaining pulse distribution similar to that observed in actual circuit in use. Distribution of SET pulse width measured by our circuit through the white neutron beam testing agrees well with that estimated by computer simulation.
Keywords :
combinational circuits; integrated circuit reliability; integrated circuit testing; neutron effects; radiation hardening (electronics); SET pulse measurement circuit; SET pulsewidth distribution; combinational logic; computer simulation; neutron-induced single event transient pulsewidth measurement; pulse detection; white neutron beam testing; Circuit simulation; Circuit testing; Databases; Error correction codes; Latches; Particle beams; Pulse circuits; Pulse measurements; Pulse width modulation inverters; Space vector pulse width modulation; SEE; SET; combinational logic; neutron; single event effects; single event transient; soft errors;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2010 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-5430-3
DOI :
10.1109/IRPS.2010.5488749