DocumentCode :
2699182
Title :
Validated electromagnetic coupling predictions for an electronic subsystem based on the finite-element time-domain method
Author :
Riley, Douglas ; Sower, Gary ; Schafer, David ; Baca, Gerald
Author_Institution :
Northrop Grumman Corp., Albuquerque, NM
fYear :
2006
fDate :
9-14 July 2006
Firstpage :
2789
Lastpage :
2792
Abstract :
The finite-element time-domain (FETD) method is used to predict electromagnetic coupling into an electronic subsystem. Accurately predicting coupling into electronics systems is challenging because small changes to geometry and materials can significantly shift the frequencies at which resonances and nulls occur. The test object consisted of two metal chassis, a variety of apertures, an unshielded wire, multipin connectors, Eccosorbtrade RF absorptive sheets, and circuit boards. Experimental validation is provided over a frequency range of 0.5 GHz to 3 GHz. The experimental response of the test object was based on illumination by a double ridge horn antenna at distances of 1 m and 7.5 m, whereas the predictions were based on free-field, plane-wave excitation. Good correlation between measurements and predictions for the amplitude and trend of the coupling data is established down to the circuit-trace level
Keywords :
electromagnetic coupling; finite element analysis; horn antennas; time-domain analysis; 0.5 to 3 GHz; Eccosorb RF absorptive sheets; circuit boards; circuit-trace level; double ridge horn antenna; electronic subsystem; finite-element time-domain method; free-field plane-wave excitation; metal chassis; multipin connectors; unshielded wire; validated electromagnetic coupling predictions; Apertures; Circuit testing; Coupling circuits; Electromagnetic coupling; Finite element methods; Geometry; Resonance; Resonant frequency; Sheet materials; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
1-4244-0123-2
Type :
conf
DOI :
10.1109/APS.2006.1711184
Filename :
1711184
Link To Document :
بازگشت