Title :
System level testability analysis using Petri nets
Author :
Jiang, Tianjing ; Klenke, Robert H. ; Aylor, James H. ; Han, Gang
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
Abstract :
The test problem increasingly affects system design costs. One approach for reducing testing difficulties is to consider system testability as early as possible in the design cycle. The technique described herein adds a testability analysis capability to the ADEPT high-level performance modeling environment. This capability provides the designer with feedback on the testability of the specific architecture being modeled at an abstract level. The testability information is expressed in the form of measures of the relative controllability and observability of signals in the system architecture. The testability information is derived from reachability graph analysis of the corresponding Petri net representation of the system architecture. This methodology has the potential to provide valuable assistance in designing systems which have lower cost, higher performance, and which also meet testability requirements
Keywords :
Petri nets; controllability; formal specification; observability; systems analysis; ADEPT high-level performance modeling environment; Petri net representation; Petri nets; controllability; design cycle; observability; reachability graph analysis; system architecture; system design costs; system level testability analysis; testability requirements; Controllability; Costs; Feedback; Observability; Performance analysis; Petri nets; Process design; Space exploration; System testing; Systems engineering and theory;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2000. Proceedings. IEEE International
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7695-0786-7
DOI :
10.1109/HLDVT.2000.889570