DocumentCode :
270076
Title :
Planned Unobsolescence
Author :
Davidson, Scott
Author_Institution :
Santa Clara,
Volume :
30
Issue :
6
fYear :
2013
fDate :
Dec. 2013
Firstpage :
104
Lastpage :
104
Keywords :
Aging; Integrated circuits; Portable computers; Reliability; Software; Space vehicles;
fLanguage :
English
Journal_Title :
Design & Test, IEEE
Publisher :
ieee
ISSN :
2168-2356
Type :
jour
DOI :
10.1109/MDAT.2013.2291168
Filename :
6727484
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=270076
