• DocumentCode
    2701489
  • Title

    A compact, high-speed, and low-power design for multi-pillar vertical MOSFET´s, suppressing characteristic influences by process fluctuation

  • Author

    Sakui, Koji ; Endoh, Tetsuo

  • Author_Institution
    Center for Interdiscipl. Res., Tohoku Univ., Sendai, Japan
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    30
  • Lastpage
    31
  • Abstract
    The DC and AC characteristics of the multi-pillar vertical MOSFET´s have been studied, considering the silicon pillar diameter thinning cases due to the process fluctuation. In order to suppress the pillar thinning influences, the Inter Contacts design has been proposed, which can realize the compact, high-speed, low-power, and stable circuits with the multi-pillar vertical MOSFET´s.
  • Keywords
    MOSFET; low-power electronics; AC characteristics; DC characteristics; compact high-speed low-power design; intercontact design; multipillar vertical MOSFET; process fluctuation; silicon pillar diameter thinning; Circuit synthesis; Contact resistance; Delay effects; Flash memory cells; Fluctuations; Inverters; MOSFET circuits; Manufacturing processes; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology Systems and Applications (VLSI-TSA), 2010 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    978-1-4244-5063-3
  • Electronic_ISBN
    1524-766X
  • Type

    conf

  • DOI
    10.1109/VTSA.2010.5488961
  • Filename
    5488961