DocumentCode
2701656
Title
Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations
Author
Sen, Shreyas ; Devarakond, Shyam ; Chatterjee, Abhijit
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2009
fDate
1-6 Nov. 2009
Firstpage
1
Lastpage
10
Abstract
Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortion are two significant effects in power amplifiers at high output power levels. Traditional measurement of amplitude and phase distortion in RF power amplifiers requires the use of expensive vector network analyzers (VNAs). This paper proposes a low cost and accurate test methodology for AM-AM and AM-PM measurement using distortion-to-amplitude conversion using simple load board test circuitry along with the use of hardware and software based difference generation and peak detection mechanisms. It is seen that both distortion effects can be measured with high accuracy while allowing significant reduction in test cost.
Keywords
amplitude modulation; circuit testing; distortion; nonlinear network analysis; phase modulation; power amplifiers; radiofrequency amplifiers; signal detection; AM/AM distortion measurement; AM/PM distortion measurement; RF power amplifiers; amplitude-to-amplitude distortion; amplitude-to-phase distortion; difference generation mechanism; distortion-to-amplitude conversion; distortion-to-amplitude transformation; load board test circuit; peak detection mechanism; test methodology; Circuit testing; Costs; Distortion measurement; High power amplifiers; Phase measurement; Power amplifiers; Power generation; Power measurement; Radiofrequency amplifiers; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2009. ITC 2009. International
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-4868-5
Electronic_ISBN
978-1-4244-4867-8
Type
conf
DOI
10.1109/TEST.2009.5355531
Filename
5355531
Link To Document