• DocumentCode
    2702467
  • Title

    Ultra CSPTM: a wafer level package

  • Author

    Elenius, Peter

  • Author_Institution
    Flip Chip Technol., Phoenix, AZ, USA
  • fYear
    1999
  • fDate
    14-17 Mar 1999
  • Firstpage
    241
  • Lastpage
    245
  • Abstract
    There has been a significant amount of work over the past 5 years on chip scale packaging. The majority of this work has been an extension of conventional IC packaging technology. Handling discrete devices during IC packaging for this type of CSPs results in a relatively high cost for these packages. This paper presents a wafer scale packaging technology called the Ultra CSP. Advantages of this wafer scale package include commonality with standard IC processing technology for the majority of the packaging process. This paper covers in detail the reliability results achieved for the Ultra CSP for a variety of package sizes and I/O counts covering the range typically seen in microcontrollers, flash and new DRAM architectures. There is also significant discussion on optimization work on board pad size, solder paste volume and solder paste type
  • Keywords
    DRAM chips; chip scale packaging; circuit optimisation; flash memories; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; microassembling; microcontrollers; printed circuit testing; soldering; DRAM architectures; IC packaging; IC packaging technology; IC processing technology; Ultra CSP; Ultra CSP wafer level package; board pad size; chip scale packaging; discrete device handling; flash memories; microcontrollers; optimization; package I/O count; package cost; package size; packaging process; reliability; solder paste type; solder paste volume; wafer scale package; wafer scale packaging technology; Apertures; Assembly; Chip scale packaging; Integrated circuit packaging; Life testing; Protection; Semiconductor device packaging; Semiconductor thin films; Surface-mount technology; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 1999. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-56-4
  • Type

    conf

  • DOI
    10.1109/ISAPM.1999.757320
  • Filename
    757320