Title :
A simple model for distributed base impedance with AC verification using S-parameter measurements
Author :
Cho, Hanjin ; Burk, D.E.
Author_Institution :
Dept. of Electr. Eng., Florida Univ., Gainesville, FL, USA
Abstract :
A simple model for distributed quasi-three-dimensional base impedance that is generally applicable for any bipolar circuit model and accounts for DC and AC base crowding is presented. It is shown to be self-consistent with parameter extraction using S-parameter measurements corrected by equivalent-circuit deembedding
Keywords :
S-parameters; bipolar transistors; electric impedance; equivalent circuits; semiconductor device models; AC base crowding; AC verification; BJT; DC base crowding; S-parameter; bipolar circuit model; bipolar transistor; distributed base impedance; equivalent-circuit deembedding; model; Bipolar transistors; Circuits; Contact resistance; Delay; Electric variables measurement; Electrical resistance measurement; Gain measurement; Impedance measurement; Parameter extraction; Scattering parameters;
Conference_Titel :
Bipolar Circuits and Technology Meeting, 1990., Proceedings of the 1990
Conference_Location :
Minneapolis, MN
DOI :
10.1109/BIPOL.1990.171138
