DocumentCode :
2702722
Title :
Study on the relationship between the surface composition of copper pads and no-flow underfill fluxing capability
Author :
Shi, S.H. ; Lu, D. ; Wong, C.P.
Author_Institution :
Center of Packaging Res., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1999
fDate :
14-17 Mar 1999
Firstpage :
325
Lastpage :
332
Abstract :
The purpose of this paper is to investigate the effect of copper pad surface composition on the wetting of solder bumps during reflow processing for a certain no-flow underfill material. A purchased uncleaned copper foil which was laminated on FR4 board and an in-house developed G25 no-flow underfill encapsulant were used in this study. Six different procedures were followed to clean the copper foil to obtain six different surfaces. XPS was then used to examine the surface composition of the six surfaces and the uncleaned surface (as a control). The actual wetting test for each surface was performed using small eutectic solder balls. The correlation of the surface composition of copper foil (equivalent to the copper pads of substrates) with the solder wetting was then established. The composition of the copper foil surface was verified to depend on the cleaning procedure. For G25 no-flow underfill material, copper oxide (CuO) is the main composition that prevents the solder ball from wetting the copper foils, while the observed organic contamination does not have a noticeable effect on the solder wetting
Keywords :
X-ray photoelectron spectra; copper; encapsulation; flip-chip devices; foils; integrated circuit packaging; laminates; microassembling; reflow soldering; surface cleaning; surface composition; surface contamination; wetting; Cu; CuO-Cu; cleaning procedure; copper foil; copper foil cleaning; copper foil laminated FR4 board; copper oxide composition; copper pad surface composition; copper pads; eutectic solder balls; flip chip technology; no-flow underfill encapsulant; no-flow underfill fluxing capability; no-flow underfill material; organic contamination; reflow processing; solder ball wetting; solder bumps; solder wetting; surface composition; uncleaned surface; wetting; wetting test; Atherosclerosis; Composite materials; Copper; Materials science and technology; Packaging; Performance evaluation; Solvents; Surface cleaning; Surface contamination; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties and Interfaces, 1999. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-56-4
Type :
conf
DOI :
10.1109/ISAPM.1999.757333
Filename :
757333
Link To Document :
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