DocumentCode :
2703227
Title :
Effect of silver content and vacuum reflow soldering on thermal fatigue life of Sn-Ag-Cu solder
Author :
Yamabe, Mitsuharu
Author_Institution :
Corp. Manuf. Eng. Center, Toshiba Corp., Yokohama, Japan
fYear :
2015
fDate :
14-17 April 2015
Firstpage :
590
Lastpage :
595
Abstract :
Sn-Ag-Cu solder which reduced silver content may be increasing of the market share in the future. Applicability to products, sufficient examination is required for low silver solder used in harsh environments. It is because change of the solder joint reliability by silver contents. Moreover, silver content influences solder wettability and the amounts of voids in the solder joints. In order to decrease the void, the vacuum reflow process was developed. Experimental evaluation of the thermal fatigue which discovered the influence of silver contents of solder and the amount of voids was performed. The thermal fatigue lifetime was prolonged with the increase in silver. By vacuum reflow, the void decreased and the thermal fatigue life-time was prolonged. However, this tendency was not seen with parts with big solder joint area. This result show that crack progress may not have regularity.
Keywords :
copper alloys; reflow soldering; reliability; silver alloys; solders; thermal stress cracking; tin alloys; vacuum techniques; voids (solid); wetting; SnAgCu; crack progress; silver content; silver solder; solder joint area; solder joint reliability; solder joints; solder wettability; thermal fatigue lifetime; vacuum reflow process; vacuum reflow soldering; Fatigue; Nitrogen; Reliability; Resistors; Silver; Soldering; Tin; Crack growth; Lead-free solder; Reliability; Sn-Ag-Cu; Thermal fatigue;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging and iMAPS All Asia Conference (ICEP-IACC), 2015 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-4-9040-9012-1
Type :
conf
DOI :
10.1109/ICEP-IAAC.2015.7111083
Filename :
7111083
Link To Document :
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