DocumentCode
270346
Title
Quasi-digital front-ends for current measurement in integrated circuits with giant magnetoresistance technology
Author
De Marcellis, A. ; Cubells-BeltraÌn, MariÌa-Dolores ; Reig, Candid ; Madrenas, J. ; Zadov, Boris ; Paperno, Eugene ; Cardoso, Susana ; Freitas, P.P.
Author_Institution
Dept. of Ind. & Inf. Eng. & Econ., Univ. of L´Aquila, L´Aquila, Italy
Volume
8
Issue
4
fYear
2014
fDate
Jul-14
Firstpage
291
Lastpage
300
Abstract
In this study, the authors report on two different electronic interfaces for low-power integrated circuits electric current monitoring through current-to-frequency (I-f) conversion schemes. This proposal displays the intrinsic advantages of the quasi-digital systems regarding direct interfacing and self-calibrating capabilities. In addition, as current-sensing devices, they have made use of the giant magnetoresistance (GMR) technology because of its high sensitivity and compatibility with standard complementary metal oxide semiconductor processes. Single elements and Wheatstone bridges based on spin-valves and magnetic tunnel junctions have been considered. In this sense, schematic-level simulations for integration in Austria Microsystems 0.35 μm technology have been corroborated by means of experimental measurements with the help of printed circuit board prototypes and real GMR devices. Tables with relevant parameters (silicon area, power consumption, sensitivity etc.) have been constructed as practical tools for designers. Electric currents down to 2 μA have been resolved in this way.
Keywords
CMOS integrated circuits; electric current measurement; giant magnetoresistance; integrated circuit measurement; low-power electronics; printed circuits; spin valves; Austria Microsystems technology; Wheatstone bridges; current measurement; current-to-frequency conversion schemes; electric current monitoring; electronic interfaces; giant magnetoresistance technology; integrated circuits; low-power integrated circuits; magnetic tunnel junctions; power consumption; printed circuit board prototypes; quasidigital front-ends; sensitivity; silicon area; size 0.35 mum; spin-valves; standard complementary metal oxide semiconductor processes;
fLanguage
English
Journal_Title
Circuits, Devices & Systems, IET
Publisher
iet
ISSN
1751-858X
Type
jour
DOI
10.1049/iet-cds.2013.0348
Filename
6855509
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