Title :
Test Mode Entry and Exit Methods for IEEE P1581 compliant devices
Author :
Ehrenberg, Heiko
Author_Institution :
IEEE P1581 Working Group, GOEPEL Electron. - Austin, Austin, TX, USA
Abstract :
IEEE P1581 is aimed at ICs that are otherwise not provisioned with design for test (DFT) for any reason, targeting primarily memory devices, but also allowing for implementation in other devices. This poster provides an overview of test mode entry and exit methods proposed in IEEE P1581.
Keywords :
integrated circuit testing; integrated memory circuits; IC; IEEE P1581 compliant devices; memory devices; test mode entry method; test mode exit method; Automatic testing; Circuit testing; Electronic equipment testing; Integrated circuit testing; Logic testing; Pins; Protocols; Read-write memory; System testing; USA Councils;
Conference_Titel :
Test Conference, 2009. ITC 2009. International
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4868-5
Electronic_ISBN :
978-1-4244-4867-8
DOI :
10.1109/TEST.2009.5355636
