• DocumentCode
    2705729
  • Title

    HFSS simulation of GTEM cell and analysis of normalized electric-field strength in EMI measurements of GTEM cell

  • Author

    Li, Ji ; Li, ShuFang ; Xing, Shuguang ; Kan, Runtian

  • Author_Institution
    Sch. of Inf. & Commun. Eng., Beijing Univ. of Posts & Telecommun., Beijing, China
  • fYear
    2009
  • fDate
    27-29 Oct. 2009
  • Firstpage
    378
  • Lastpage
    380
  • Abstract
    Since the appearance of GTEM cell, recent years more and more people put emphases on using it to do EMI measurements. Many papers simulate GTEM cell using FDTD method or software based on FDTD, while this paper pick up HFSS software based on FEM to simulate GTEM cell and check the credibility of simulation from two aspects: characteristic impendence and output power of port. Besides, the normalized electric-field strength which is an important parameter in using GTEM cell to do EMI measurements is analyzed and discussed from simulation and experiments to get useful conclusions.
  • Keywords
    TEM cells; electric field measurement; electromagnetic interference; finite difference time-domain analysis; finite element analysis; EMI measurements; FDTD method; FEM; GTEM cell; HFSS simulation; normalized electric field strength; Analytical models; Conducting materials; Electric variables measurement; Electromagnetic interference; Finite difference methods; Power generation; Power transmission lines; TEM cells; Time domain analysis; Transmission line theory; GTEM Cell; HFSS; e0y;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4076-4
  • Type

    conf

  • DOI
    10.1109/MAPE.2009.5355737
  • Filename
    5355737