DocumentCode :
2706573
Title :
Moment method solution of the EFIE for TE-wave scattering by conducting cylinders using basis and testing functions lacking in sufficient degrees of differentiability
Author :
Xu, Yun-Sheng ; Wang, Kan
Author_Institution :
Dept. of Electron. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China Hefei, Hefei, China
fYear :
2009
fDate :
27-29 Oct. 2009
Firstpage :
917
Lastpage :
920
Abstract :
The application of the method of moments usually requires a minimum degree of differentiability for basis and testing functions. Through the solution of the electric field integral equation (EFIE) for scattering by a perfect conducting cylinder illuminated by a TE wave, however, it is shown that such a restriction can be loosed. Theoretically, pulse basis functions and point matching are usually considered to be not suitable for the solution of the TE EFIE for lack of sufficient degrees of differentiability. Nevertheless proper treatment still permits their application. The basic idea is to avoid or eliminate all the nonphysical terms in the discretized equations produced by point matching. Several methods to tackle this problem are theoretically investigated and validated through numerical results for cylinders of various geometries.
Keywords :
electric field integral equations; electromagnetic wave scattering; method of moments; TE-wave scattering; differentiability constraint; electric field integral equation; electrical field integral equation; electromagnetic wave scattering; moment method solution; perfect conducting cylinders; Constraint theory; Electromagnetic scattering; Electronic equipment testing; Engine cylinders; Geometry; Information science; Integral equations; Moment methods; Spectral analysis; Tellurium; differentiability constraint; electrical field integral equation; electromagnetic wave scattering; method of moments; perfect conducting cylinders;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2009 3rd IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-4076-4
Type :
conf
DOI :
10.1109/MAPE.2009.5355779
Filename :
5355779
Link To Document :
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