• DocumentCode
    2708158
  • Title

    The effects of EMI from cell phones on GMR magnetic recording heads and test equipment

  • Author

    Kraz, Vladimir ; Wallash, Albert

  • Author_Institution
    Credence Technol. Inc., Soquel, CA, USA
  • fYear
    2000
  • fDate
    26-28 Sept. 2000
  • Firstpage
    224
  • Lastpage
    232
  • Abstract
    In this work, we study the effects of electromagnetic interference (EMI) on GMR heads and test equipment. It was found that three types of cell phones (AMPS, TDMA and CDMA) did not cause magnetic or resistance change damage to the GMR heads, such as that caused by nearby ESD events. It was also found that EMI from a TDMA cell phone caused errors in a spin stand tester that could disrupt the test process and create yield losses in production. It is concluded that it may be prudent to restrict operation of mobile phones in the immediate proximity of GMR heads during handling and testing.
  • Keywords
    cellular radio; code division multiple access; electromagnetic interference; electronic equipment manufacture; electronic equipment testing; giant magnetoresistance; magnetic heads; magnetic recording; magnetoresistive devices; test equipment; time division multiple access; AMPS; CDMA; EMI; ESD events; GMR head handling; GMR head test equipment; GMR head testing; GMR heads; GMR magnetic recording heads; TDMA; TDMA cell phone; cell phones; electromagnetic interference; magnetic damage; mobile phone operation restrictions; production yield losses; resistance change damage; spin stand tester errors; test equipment; test process; Cellular phones; Electromagnetic interference; Electrostatic discharge; Electrostatic interference; Magnetic heads; Magnetic recording; Multiaccess communication; Test equipment; Testing; Time division multiple access;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
  • Conference_Location
    Anaheim, CA, USA
  • Print_ISBN
    1-58537-018-5
  • Type

    conf

  • DOI
    10.1109/EOSESD.2000.890050
  • Filename
    890050