DocumentCode :
2708172
Title :
Investigation of ESD transient EMI causing spurious clock track read transitions during servo-write
Author :
Yap, Ber-Chin ; Patton, Charles R.
Author_Institution :
Western Digital, Malaysia
fYear :
2000
fDate :
26-28 Sept. 2000
Firstpage :
233
Lastpage :
238
Abstract :
A simple loop antenna detector was used to successfully troubleshoot reference clock failures during servo-write that were caused by the EMI from distant metal-to-metal ESD events. Covering one metal surface with a dissipative material reduced the discharge rate and EMI. This approach proved effective for stopping such ESD EMI induced production yield loss. This case study concludes that it is necessary to also control those areas immediately adjacent to ESD protected production lines to protect these areas against strong indirect ESD EMI.
Keywords :
assembling; clocks; electromagnetic interference; electronic equipment manufacture; electronic equipment testing; electrostatic discharge; error analysis; loop antennas; reliability; servomechanisms; transient analysis; EMI; ESD EMI induced production yield loss; ESD protected production lines; ESD transient EMI; discharge rate; distant metal-to-metal ESD events; loop antenna detector; metal surface dissipative material covering; reference clock failures; servo-write; spurious clock track read transitions; strong indirect ESD EMI; Clocks; Electromagnetic interference; Electromagnetic radiation; Electrostatic discharge; Event detection; Fault location; Gas detectors; Oscilloscopes; Production; Protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000
Conference_Location :
Anaheim, CA, USA
Print_ISBN :
1-58537-018-5
Type :
conf
DOI :
10.1109/EOSESD.2000.890051
Filename :
890051
Link To Document :
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