• DocumentCode
    2709103
  • Title

    EDA for analog DFT? - designers must get on the bus

  • Author

    Sunter, Stephen

  • Author_Institution
    LogicVision (Canada), Inc., Ottawa, ON, Canada
  • fYear
    2009
  • fDate
    1-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Design for test (DFT) for analog functions lags far behind that for digital functions, and as a result there is virtually no automation (except BIST for SerDes, PLL, and DDR). Before such automation can be developed, we must first understand the reasons for this lag and address them, since without a widely used technique, EDA companies cannot develop truly useful DFT automation. Analog design has no general-purpose DFT technique comparable to digital´s scan-based design and testing. The closest possibility is the analog bus, but it is often inadequate. Let´s consider three important reasons for the lack of a general analog DFT technique.
  • Keywords
    design for testability; electronic design automation; DFT automation; EDA; analog DFT; analog bus; analog design; analog functions; design for test; electronic design automation; scan-based design; scan-based testing; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Design automation; Design for testability; Electronic design automation and methodology; Integrated circuit testing; Logic design; Logic testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2009. ITC 2009. International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4868-5
  • Electronic_ISBN
    978-1-4244-4867-8
  • Type

    conf

  • DOI
    10.1109/TEST.2009.5355909
  • Filename
    5355909