Title :
Spontaneous emission rate of erbium implanted in silica near a dielectric interface
Author :
Snoeks, E. ; Lagendijk, Ad ; Brongersma, Mark L. ; Polman, A.
Author_Institution :
FOM-Institute for Atomic and Molecular Physics
fDate :
29 Aug-2 Sep 1994
Keywords :
Dielectrics; Erbium; Glass; Optical refraction; Photoluminescence; Refractive index; Silicon compounds; Solids; Spontaneous emission; Stimulated emission;
Conference_Titel :
Quantum Electronics Conference, 1994., Proceedings of 5th European
Print_ISBN :
0-7803-1791-2
DOI :
10.1109/EQEC.1994.698270
