Title :
Building reliability monitors for power semiconductor devices
Author :
Galateanu, L. ; Tibeica, C. ; Turtudau, F.
Author_Institution :
Nat. Inst. for R&D in Microtechnol., Bucharest, Romania
Abstract :
Statistical analyses were used to build an efficient reliability monitor for power semiconductor devices. Benefits for the device manufacturing are obtained
Keywords :
power semiconductor devices; semiconductor device reliability; power semiconductor device manufacturing; reliability monitor; statistical analysis; Fabrication; Fingerprint recognition; Life estimation; Power semiconductor devices; Schottky diodes; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor devices; Statistical analysis; Testing;
Conference_Titel :
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-5885-6
DOI :
10.1109/SMICND.2000.890232
